Glancing-incidence x-ray fluorescence of layered materials
β Scribed by de Boer, D. K. G.
- Book ID
- 118063302
- Publisher
- The American Physical Society
- Year
- 1991
- Tongue
- English
- Weight
- 619 KB
- Volume
- 44
- Category
- Article
- ISSN
- 1098-0121
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl
In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓectivity and angle-dependent x-ray Γuorescence measurements are combin