𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Glancing-incidence x-ray fluorescence of layered materials

✍ Scribed by de Boer, D. K. G.


Book ID
118063302
Publisher
The American Physical Society
Year
1991
Tongue
English
Weight
619 KB
Volume
44
Category
Article
ISSN
1098-0121

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Glancing-incidence X-ray analysis
✍ W.W. Van Den Hoogenhof; D.K.G. De Boer πŸ“‚ Article πŸ“… 1993 πŸ› Elsevier Science 🌐 English βš– 670 KB
Glancing-incidence and glancing-takeoff
✍ Kouichi Tsuji; Kazuaki Wagatsuma; Takeo Oku πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 1 views

A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl

Applications of Glancing Incidence X-Ray
✍ A. J. G. Leenaers; D. K. G. de Boer πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 481 KB πŸ‘ 1 views

In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓ‘ectivity and angle-dependent x-ray Γ‘uorescence measurements are combin