๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Applications of Glancing Incidence X-Ray Analysis

โœ Scribed by A. J. G. Leenaers; D. K. G. de Boer

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
481 KB
Volume
26
Category
Article
ISSN
0049-8246

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โœฆ Synopsis

In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reร‘ectivity and angle-dependent x-ray ร‘uorescence measurements are combined, resulting in a structural and chemical analysis of the samples.

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