𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Glancing-incidence X-ray analysis

✍ Scribed by W.W. Van Den Hoogenhof; D.K.G. De Boer

Book ID
113374880
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
670 KB
Volume
48
Category
Article
ISSN
0584-8547

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Applications of Glancing Incidence X-Ray
Applications of Glancing Incidence X-Ray Analysis
✍ A. J. G. Leenaers; D. K. G. de Boer πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 481 KB πŸ‘ 1 views

In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓ‘ectivity and angle-dependent x-ray Γ‘uorescence measurements are combin

Glancing-incidence and glancing-takeoff
Glancing-incidence and glancing-takeoff x-ray fluorescence analysis of Ni–GaAs interface reactions
✍ Kouichi Tsuji; Kazuaki Wagatsuma; Takeo Oku πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 127 KB πŸ‘ 1 views

A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl