Glancing incidence X-ray analysis: more than just reflectivity!
β Scribed by A.J.G Leenaers; J.J.A.M Vrakking; D.K.G de Boer
- Book ID
- 114254481
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 558 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0584-8547
No coin nor oath required. For personal study only.
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In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓectivity and angle-dependent x-ray Γuorescence measurements are combin
A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl