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Glancing incidence X-ray analysis: more than just reflectivity!

✍ Scribed by A.J.G Leenaers; J.J.A.M Vrakking; D.K.G de Boer


Book ID
114254481
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
558 KB
Volume
52
Category
Article
ISSN
0584-8547

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In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓ‘ectivity and angle-dependent x-ray Γ‘uorescence measurements are combin

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A thermally stable Ni-based ohmic contact is one of the most attractive contact materials for developing superior GaAs devices. To understand the interface reaction between an Ni thin film and a GaAs wafer, a combined grazing-incidence and grazing-takeoff x-ray fluorescence (GIT-XRF) method was appl