In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓectivity and angle-dependent x-ray Γuorescence measurements are combin
β¦ LIBER β¦
Glancing-incidence X-ray characterization of Nb/Pd multilayers
β Scribed by M. A. Tagliente; A. Del Vecchio; L. Tapfer; C. Coccorese; L. Mercaldo; L. Maritato; J. M. Slaughter; C. M. Falco
- Book ID
- 105702797
- Publisher
- Italian Physical Society
- Year
- 1997
- Tongue
- English
- Weight
- 533 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0392-6737
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