By condensation of C6o and C7o fullerenes the formation of continuous, thick epitaxial t-SiC films on Si(001) and Si(lll) surfaces is possible, even at moderate temperatures (700 °C-1000 °C). The dependence of structure, topography, and composition of the epitaxial silicon carbide layers formed by C
Synthesis of epitaxial 3C-SiC by C60 carbonization of silicon on sapphire
✍ Scribed by K. Volz; J. Müller; W. Reiber; B. Rauschenbach; B. Stritzker
- Book ID
- 104107375
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 330 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0008-6223
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✦ Synopsis
C, molecule deposition onto commercial SOS (silicon on sapphire) wafers with (001) silicon on r-plane (1102) sapphire results in the formation of silicon carbide (Sic), if substrate temperatures of 810°C are exceeded. Elastic recoil spectroscopy indicates the formation of a stoichiometric Sic layer. X-ray pole figure measurements show that the main part of the resulting cubic 3C-Sic grows epitaxially with the underlaying silicon. Cross-sectional transmission electron microscopic investigations indicate as well that the 3C-Sic exhibits an epitaxial relationship to the Si matrix and that the resulting Sic grains grow columnarly.
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## Abstract Due to the large difference in lattice parameters and thermal expansion coefficients, the hetero‐epi‐ taxial growth of 3C–SiC on Si mainly results in highly defective layers on strongly bent wafers. The defects may not be detrimental for very basic applications, but the bow is. In order