SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, USA (Saturday 21 January 2012)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI - Performance prediction and characterization of highly insulated microbolometers for space applications

✍ Scribed by Xu, Zhiqiang; Ngo Phong, Linh; Pope, Timothy D.; García-Blanco, Sonia M.; Ramesham, Rajeshuni

• Book ID: 120607615
• Publisher: SPIE
• Year: 2012
• Weight: 285 KB
• Volume: 8250
• Category: Article
• DOI: 10.1117/12.909573