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SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, USA (Saturday 21 January 2012)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI - Performance prediction and characterization of highly insulated microbolometers for space applications

✍ Scribed by Xu, Zhiqiang; Ngo Phong, Linh; Pope, Timothy D.; García-Blanco, Sonia M.; Ramesham, Rajeshuni


Book ID
120607615
Publisher
SPIE
Year
2012
Weight
285 KB
Volume
8250
Category
Article

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