✦ LIBER ✦

SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Small size probe for inner profile measurement of pipes using optical fiber ring beam device

✍ Scribed by Wakayama, Toshitaka; Machi, Kizuku; Yoshizawa, Toru; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

No coin nor oath required. For personal study only.

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