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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Coordinates calibration in precision detection of 3D optical deformation measurement system

✍ Scribed by Lu, Honggang; Hu, Chunsheng; Wang, Xingshu; Gao, Yang; Wu, Wei; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

Book ID: 120786179
Publisher: SPIE
Year: 2012
Weight: 568 KB
Volume: 8563
Category: Article
DOI: 10.1117/12.2000586

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