SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Simulation of real-time large-scale absolute distance measurement with a pair of femtosecond frequency comb lasers

✍ Scribed by Li, Yang; Zhou, Qian; Ni, Kai; Wu, Guanhao; Qiao, Xiaorui; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

• Book ID: 120530324
• Publisher: SPIE
• Year: 2012
• Weight: 456 KB
• Volume: 8563
• Category: Article
• DOI: 10.1117/12.999976