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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Simultaneous measurement of birefringence magnitude and direction using Wollaston prism

✍ Scribed by Liu, Longhai; Zeng, Aijun; Chen, Beishi; Zheng, Lexing; Huang, Huijie; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

Book ID: 118035633
Publisher: SPIE
Year: 2012
Weight: 573 KB
Volume: 8563
Category: Article
DOI: 10.1117/12.999670

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