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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Simultaneous measurements of atmospheric NO 2 and HONO using IBBCEAS with a near-ultraviolet LED

✍ Scribed by Ling, Liuyi; Xie, Pinhua; Qin, Min; Hu, Renzhi; Zheng, Nina; Si, Fuqi; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

Book ID: 120178590
Publisher: SPIE
Year: 2012
Weight: 386 KB
Category: Article
DOI: 10.1117/12.999572

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