✦ LIBER ✦

SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Traceable dual-frequency measurement of Zeeman split He-Ne lasers using an optical frequency comb locked external cavity diode laser

✍ Scribed by Wei, Haoyun; Wu, Xuejian; Zhou, Lei; Zhang, Jitao; Li, Yan; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

No coin nor oath required. For personal study only.

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