✦ LIBER ✦

SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Algorithm research of high-precision optical interferometric phase demodulation based on FPGA

✍ Scribed by Zhi, Chunxiao; Sun, Jinghua; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

No coin nor oath required. For personal study only.

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