✦ LIBER ✦

SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - FPGA-based signal processing in an optical feedback self-mixing interferometry system

✍ Scribed by Li, Zongzhen; Yu, Yanguang; Xi, Jiangtao; Ye, Huiying; Harding, Kevin; Huang, Peisen S.; Yoshizawa, Toru

No coin nor oath required. For personal study only.

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