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Spatial Distributions of Trapping Centers in HfO2/SiO2 Gate Stack

✍ Scribed by Heh, D.; Young, C.D.; Brown, G.A.; Hung, P.Y.; Diebold, A.; Vogel, E.M.; Bernstein, J.B.; Bersuker, G.

Book ID: 114618748
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 446 KB
Volume: 54
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2007.896371

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