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Distribution and generation of traps in SiO2/Al2O3 gate stacks

✍ Scribed by Isodiana Crupi; Robin Degraeve; Bogdan Govoreanu; David P. Brunco; Philippe Roussel; Jan Van Houdt

Book ID: 108210683
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 129 KB
Volume: 47
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2007.01.013

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