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Charge carrier generation/trapping mechanisms in HfO2/SiO2 stack

✍ Scribed by Piyas Samanta; Chunxiang Zhu; Mansun Chan

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 366 KB
Volume: 84
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2007.04.084

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