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Investigation on trapping and detrapping mechanisms in HfO2 films

✍ Scribed by J. Mitard; C. Leroux; G. Ghibaudo; G. Reimbold; X. Garros; B. Guillaumot; F. Boulanger

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 419 KB
Volume: 80
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2005.04.092

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