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Charge trapping and detrapping phenomena in thin oxide-nitride-oxide stacked films

✍ Scribed by S.K. Lee; J.H. Chen; Y.H. Ku; D.L. Kwong; B.Y. Nguyen; K.W. Teng


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
298 KB
Volume
31
Category
Article
ISSN
0038-1101

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