Study of electron traps in the thin interfacial oxide layer of Al-, Au- and Sn-n GaAs Schottky barriers by detrapping experiments

✍ Scribed by R.L. Van Meirhaeghe; W.H. Laflère; F. Cardon

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 422 KB
• Volume: 25
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(82)90146-0