Electron trapping in the oxide layer of MIS-type Al Au Ag and Sn-n-type GaAs Schottky barriers

✍ Scribed by W.H. Laflère; R.L. Van Meirhaeghe; F. Cardon

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 419 KB
• Volume: 25
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(82)90124-1