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Charge trapping and retention in ultra-thin oxide-nitride-oxide structures

✍ Scribed by P. Olivo; Z.A. Weinberg; K.J. Stein; D.S. Wen

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 242 KB
Volume: 34
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(91)90134-k

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