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Determination of tunnelling parameters in ultra-thin oxide layer poly-Si/SiO2/Si structures

✍ Scribed by M Depas; B Vermeire; P.W Mertens; R.L Van Meirhaeghe; M.M Heyns


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
709 KB
Volume
38
Category
Article
ISSN
0038-1101

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