Study of shallow bulk traps in thin nitrided oxide films by thermal re-emission of electrons trapped at high field

✍ Scribed by B.L Yang; H Wong; Y.C Cheng

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 455 KB
• Volume: 38
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(95)00013-j