✦ LIBER ✦
Charge trapping and detrapping phenomena in thin oxidenitride-oxide stacked films : S. K. Lee, J. H. Chen, Y. H. Ku, D. L. Kwong, B. Y. Nguyen and K. W. Teng. Solid-St. Electron. 31, 1501 (1988)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 122 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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