Simulated annealing is proposed as a simulation method for single-electron tunnel devices and circuits. Tunnel junctions, voltage sources and capacitors are used as elements for the construction of single-electron circuits. The simulator is applied successfully to the twostage tunnel junction invert
SIMON-A simulator for single-electron tunnel devices and circuits
β Scribed by Wasshuber, C.; Kosina, H.; Selberherr, S.
- Book ID
- 119778223
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 219 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0278-0070
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π SIMILAR VOLUMES
We introduce a single-electron device and circuit simulator, called SIMON, with the following features. Tunnel junctions, capacitors, constant voltage sources, piecewise-linear time-dependent voltage sources and voltage controlled voltage sources can be connected arbitrarily to form a single-electro
## Abstract A circuit theory for metallic singleβelectron tunnelling (SET) junctions is presented. In detail circuits with a single SET junction in arbitrary environments are described. Based on the conservation of energy in the circuitsβa fundamental circuit theoremβequivalent circuit elements are