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Static and Dynamic Modeling of Single-Electron Memory for Circuit Simulation

✍ Scribed by Wei Xuan; Beaumont, A.; Guilmain, M.; Bounouar, M.; Baboux, N.; Etzkorn, J.; Drouin, D.; Calmon, F.

Book ID: 114620785
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 890 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2173347

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