Simulated annealing is proposed as a simulation method for single-electron tunnel devices and circuits. Tunnel junctions, voltage sources and capacitors are used as elements for the construction of single-electron circuits. The simulator is applied successfully to the twostage tunnel junction invert
Towards a circuit theory for metallic single-electron tunnelling devices
✍ Scribed by J. Hoekstra
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 253 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0098-9886
- DOI
- 10.1002/cta.412
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✦ Synopsis
Abstract
A circuit theory for metallic single‐electron tunnelling (SET) junctions is presented. In detail circuits with a single SET junction in arbitrary environments are described. Based on the conservation of energy in the circuits—a fundamental circuit theorem—equivalent circuit elements are proposed and possible physical justifications are presented. The resulting model represents the tunnel event by an impulse current source, the junction by a charged capacitor, and the tunnelling condition as a discrete process based on local circuit parameters—and may include a tunnelling time. Simple examples illustrate Coulomb blockade, Coulomb oscillations, and continuous direct tunnelling. Copyright © 2007 John Wiley & Sons, Ltd.
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