✦ LIBER ✦

Research on single event transient pulse quenching effect in 90 nm CMOS technology

✍ Scribed by JunRui Qin; ShuMing Chen; BiWei Liu; JianJun Chen; Bin Liang; Zheng Liu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of Digital Single Event

✍ Narasimham, Balaji; Bhuva, Bharat L.; Schrimpf, Ronald D.; Massengill, Lloyd W.; 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 938 KB

The Effect of Layout Topology on Single-

✍ Ahlbin, J. R.; Gadlage, M. J.; Ball, D. R.; Witulski, A. W.; Bhuva, B. L.; Reed, 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 657 KB

Increased Single-Event Transient Pulsewi

✍ Gadlage, M.J.; Ahlbin, J.R.; Narasimham, B.; Ramachandran, V.; Dinkins, C.A.; Pa 📂 Article 📅 2010 🏛 IEEE 🌐 English ⚖ 834 KB

Effect of Transistor Density and Charge

✍ Atkinson, Nicholas M.; Ahlbin, Jonathan R.; Witulski, Arthur F.; Gaspard, Nelson 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 834 KB

Single Event Effect Induced Multiple-Cel

✍ Lawrence, Reed K.; Kelly, Andrew T. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 663 KB

Impact of Circuit Placement on Single Ev

✍ He Yibai, ; Chen Shuming, ; Chen Jianjun, ; Chi Yaqing, ; Liang Bin, ; Liu Biwei 📂 Article 📅 2012 🏛 IEEE 🌐 English ⚖ 806 KB