✦ LIBER ✦
Single Event Effect Induced Multiple-Cell Upsets in a Commercial 90 nm CMOS Digital Technology
✍ Scribed by Lawrence, Reed K.; Kelly, Andrew T.
- Book ID
- 111927726
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 663 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9499
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