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Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOS

✍ Scribed by Atkinson, Nicholas M.; Ahlbin, Jonathan R.; Witulski, Arthur F.; Gaspard, Nelson J.; Holman, W. Timothy; Bhuva, Bharat L.; Zhang, Enxia X.; Chen, Li; Massengill, Lloyd W.

Book ID: 115527120
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 834 KB
Volume: 58
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2011.2168425

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