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Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

✍ Scribed by Narasimham, Balaji; Bhuva, Bharat L.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Gadlage, Matthew J.; Amusan, Oluwole A.; Holman, William Timothy; Witulski, Arthur F.; Robinson, William H.; Black, Jeffrey D.; Benedetto, Joseph M.; Eaton, Paul H.

Book ID: 118123071
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 938 KB
Volume: 54
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2007.910125

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