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Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing

✍ Scribed by Lyding, J. W.; Hess, K.; Kizilyalli, I. C.

Book ID: 120939637
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 267 KB
Volume: 68
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.116172

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