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Characteristic length of hot-electron transport in silicon metalâoxideâsemiconductor field-effect transistors

✍ Scribed by Sakamoto, T.; Kawaura, H.; Baba, T.; Iizuka, T.

Book ID: 120588458
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 331 KB
Volume: 76
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.126427

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