✦ LIBER ✦

Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment

✍ Scribed by M.Q Huang; P.T Lai; J.P Xu; S.H Zeng; G.Q Li; Y.C Cheng

No coin nor oath required. For personal study only.

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✍ Van de Walle, Chris G.; Jackson, W. B. 📂 Article 📅 1996 🏛 American Institute of Physics 🌐 English ⚖ 240 KB