Comment on ‘‘Reduction of hot electron degradation in metal oxide semiconductor transistors by deuterium processing’’ [Appl. Phys. Lett. 68, 2526 (1996)]

✍ Scribed by Van de Walle, Chris G.; Jackson, W. B.

• Book ID: 120939639
• Publisher: American Institute of Physics
• Year: 1996
• Tongue: English
• Weight: 240 KB
• Volume: 69
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.117664