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Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability

✍ Scribed by Andreas Martin; Jochen von Hagen; Glenn B. Alers

Book ID: 108361988
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 306 KB
Volume: 43
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(03)00188-4

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