✦ LIBER ✦
Wafer level tunnel oxide reliability evaluation by means of the Exponentially Ramped Current Stress method
✍ Scribed by P. Cappelletti; P. Ghezzi; F. Pio
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 711 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.