[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Impact of stress induced leakage current on power-consumption in ultra-thin gate oxides

✍ Scribed by Lai, W.; Sune, J.; Wu, E.; Nowak, E.

• Book ID: 111952172
• Publisher: IEEE
• Year: 2004
• Weight: 447 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780383159
• DOI: 10.1109/relphy.2004.1315308