[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

✍ Scribed by Cannon, E.H.; Reinhardt, D.D.; Gordon, M.S.; Makowenskyj, P.S.

• Book ID: 118039860
• Publisher: IEEE
• Year: 2004
• Weight: 360 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780383159
• DOI: 10.1109/relphy.2004.1315341