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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Comparison of multiple cell upset response of BULK and SOI 130NM technologies in the terrestrial environment

✍ Scribed by Gasiot, Gilles; Roche, Philippe; Flatresse, Philippe

No coin nor oath required. For personal study only.

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