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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A novel technique for mitigating neutron-induced multi -cell upset by means of back bias

✍ Scribed by Nakauchi, Takuya; Mikami, Nobukazu; Oyama, Akira; Kobayashi, Hajime; Usui, Hiroki; Kase, Jun

Book ID: 118152371
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 237 KB
Edition: 46
Volume: 0
Category: Article
ISBN: 1424420490
DOI: 10.1109/relphy.2008.4558883

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