𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A multi-bit error detection scheme for DRAM using partial sums with parallel counters

✍ Scribed by Narasimham, Balaji; Luk, Wing K.

Book ID: 115543992
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 243 KB
Edition: 46
Volume: 0
Category: Article
ISBN: 1424420490
DOI: 10.1109/relphy.2008.4558886

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Hermeticity testing of capacitive RF MEMS switches

✍ van der Wel, P.J.; Stulemeijer, J.; Bielen, J.A.; Theunis, F.G.A.; den Dekker, A 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 279 KB

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Analytical model of radiation response in FDSOI MOSFETS

✍ McLain, Michael L.; Barnaby, Hugh J.; Adell, Philippe C. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 299 KB

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Comparison of accelerated DRAM soft error rates measured at component and system level

✍ Borucki, Ludger; Schindlbeck, Guenter; Slayman, Charles 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 244 KB

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A novel technique for mitigating neutron-induced multi -cell upset by means of back bias

✍ Nakauchi, Takuya; Mikami, Nobukazu; Oyama, Akira; Kobayashi, Hajime; Usui, Hirok 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 237 KB

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Comparison of multiple cell upset response of BULK and SOI 130NM technologies in the terrestrial environment

✍ Gasiot, Gilles; Roche, Philippe; Flatresse, Philippe 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 110 KB

[IEEE 2008 IEEE International Reliabilit

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation

✍ Weulersse, C.; Bougerol, A.; Hubert, G.; Wrobel, F.; Carriere, T.; Gaillard, R.; 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 176 KB