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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Investigation of the influence of process and design on soft error rate in integrated CMOS technologies thanks to Monte Carlo simulation

✍ Scribed by Weulersse, C.; Bougerol, A.; Hubert, G.; Wrobel, F.; Carriere, T.; Gaillard, R.; Buard, N.

No coin nor oath required. For personal study only.

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