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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Analytical model of radiation response in FDSOI MOSFETS

✍ Scribed by McLain, Michael L.; Barnaby, Hugh J.; Adell, Philippe C.

Book ID: 111863894
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 299 KB
Edition: 46
Volume: 0
Category: Article
ISBN: 1424420490
DOI: 10.1109/relphy.2008.4558967

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