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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Off-state mode TDDB reliability for ultra-thin gate oxides: New methodology and the impact of oxide thickness scaling

✍ Scribed by Wu, E.; Nowak, E.; Wing Lai,

Book ID: 126943874
Publisher: IEEE
Year: 2004
Weight: 910 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/relphy.2004.1315306

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