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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Local redesign for reliability of CMOS digital circuits under device degradation

✍ Scribed by Xiangdong Xuan, ; Chatterjee, A.; Singh, A.D.

Book ID: 120605602
Publisher: IEEE
Year: 2004
Weight: 162 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/RELPHY.2004.1315434

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