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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Gate dielectric degradation mechanism associated with DBIE evolution

✍ Scribed by Pey, K.L.; Ranjan, R.; Tung, C.H.; Tang, L.J.; Lin, W.H.; Radhakrishnan, M.K.

Book ID: 125847119
Publisher: IEEE
Year: 2004
Weight: 448 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/RELPHY.2004.1315310

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