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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - A methodology for accurate assessment of soft-broken gate oxide leakage and the reliability of VLSI circuits

✍ Scribed by Mason, P.W.; La Duca, A.J.; Holder, C.H.; Alam, M.A.; Hwang, D.K.

Book ID: 125447340
Publisher: IEEE
Year: 2004
Weight: 363 KB
Category: Article
ISBN-13: 9780780383159
DOI: 10.1109/relphy.2004.1315366

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